The NTEGRA Spectra is a unique integration of Scanning Probe Microscope, confocal microscopy/luminescence and Raman scattering spectroscopy. Owing to the effect of huge tip enhanced Raman scattering it allows carrying out Raman spectroscopy and obtaining images with resolution up to 50nm.

Only NTEGRA Spectra provides fully technical integrated with Raman spectrometer solution in terms of software, hardware, and concept for interdisciplinary science at the molecular level. As a result of such union, researchers can obtain optimum efficiency and more time for investigation which allows you to focus on data collection and analysis. So it is saffe to say: real integration is better than just a combination.

NTEGRA Spectra nanolaboratory is a system that combines confocal scanning laser spectrometer, optical microscope and universal scanning probe microscope. The system is capable of working in the mode of registration of spatial 3D distribution of luminescence spectrum and Raman light scattering, as well as various scanning probe microscopy modes that include nanoindentation, nanomanipulation and nanolithography.

Scanning Probe Microscopy System
Along with the optical observation, NTEGRA Spectra allows investigating the object with a set of SPM methods: AFM, MFM, STM, Scanning Near-Field Optical Microscopy, Force Spectroscopy. The unique combination of optical and probe methods in one device allows carrying out of complex experiments, which will provide the researcher with information on the distribution of optical properties and the object's chemistry overlapped with the mechanical, electrical and magnetic properties data.

Investigation of optical properties beyond the diffraction limit
The distinguishing feature of NTEGRA nanolaboratory is the capability of studying optical properties of objects beyond the diffraction limits. Scanning Near-Field Optical Microscopy and the effect of local tip enhanced Raman scattering provides the researcher with the tools for mapping the optical properties distribution (light transmission, light scattering, light polarization, etc.) as well as carrying out Raman scattering spectroscopy with flat XY resolution up to 50nm.

• Atomic Force Microscopy (>30 modes)
• Confocal Raman/Fluorescence/Rayleigh Microscopy
• Scanning Near-Field Optical Microscopy (SNOM/NSOM)
• Optimized for Tip Enhanced Raman Scattering (TERS)
  

The Solver Next is the first to offer a new concept in general purpose Scanning Probe Microscopes. This new Scanning Probe Microscope design offers desk top automation opening the way for all user levels to acquire quality Scanning Probe Microscope images in a short amount of time.

The hassle of manual setup has been eliminated. Intuitive automation guides you through the setup, adjustment and samples measurements. The system incorporates smart software, automated exchange between built-in Atomic Force Microscope and Scanning Tunneling Microscope heads, motorized sample positioning under video monitored control, ergonomic design at a reasonable price - all this makes Scanning Probe Microscopy operation suitable for even a novice.

There's much more to the Solver Next than the integrated Atomic Force Microscope & Scanning Tunneling Microscope, hardware & software automation, with an ergonomic design that's easy to use:

• Atomic Force Microscopy (>30 modes)
• Scanning Tunneling Microscopy
• Nanolithography and Nanomanipulation
• Single click alignment of laser to cantilever
• Closed-loop feedback for all Scanning Probe Microscope Modes
• Fast Atomic Force Microscopy scanning up to 40 Hz dependent on sample
• Optional liquid cell, sample heater and nanoidentation
• Remote access and control with your iPad and iPhone applications for reviewing and sharing your images
• Much more...
  

The NTEGRA is a revolutionary concept in Scanning Probe Microscopy. It was designed specifically to form a Scanning Probe Microscope base platform for integration with cutting-edge analysis technologies such as Raman spectroscopy and other leading analytical techniques. The NTEGRA is a scaleable platform and expands modularly with your application needs. Each NTEGRA platform shares the same Scanning Probe Microscope core, electronic controller and software. Instead of investing in a complete new system, you simply add the module that meets your current application.

There is a wide variety of advanced scanning probe modes in use today. Many of these modes are standard with the NTEGRA.

• Magnetic Force Microscopy
• Electro Static Force Microscopy
• Scanning Kelvin Probe Microscopy
• Piezoresponse Force Microscopy
• Nanolithography
• Nanomanipulation
• Adhesion Force Imaging
• Many more... 

The NTEGRA currently offers eight solutions for various Scanning Probe Microscope applications. Each system offers superior performance and has it's own area of specialization.

• NTEGRA Prima - is a high resolution, low noise Scanning Probe Microscope ideal for advanced multi-user laboratories.
• NTEGRA Therma - performs Scanning Probe Microscopy measurements at either constant or variable temperatures from -30 ⁰C to 300 ⁰C. The Therma low drift head maintains a drift of less than 15nm/⁰C.
• NTEGRA Aura - performs Atomic Force Microscope measurements in vacuum down to 10^-2 torr or under controlled atmosphere environments.
• NTEGRA Maximus - Atomic Force Microscope has a unique high throughput screening capability of multiple samples as well as measurements on large sample substrates.
• NTEGRA Solaris - uses Near-Field Scanning Optical Microscopy (NSOM or SNOM) to investigate optical properties beyond conventional limits imposed by diffraction.
• NTEGRA Spectra - integrates Scanning Probe Microscopy with Raman spectroscopy and laser confocal microscopy to study the distribution of chemical properties with molecular resolution. The Spectra is the first commercialized Tip Enhanced Raman Scattering (TERS) ready system. This improves both spatial resolution and Raman sensitivity.
• NTEGRA Vita - combines the strengths of Atomic Force Microscopy with an inverted optical microscope for biological and liquid applications.
• NTEGRA Tomo - is a unique industry leading innovation, integrating Atomic Force Microscopy with ultramicrotomy to perform Atomic Force Microscope tomography and 3D reconstruction of biological and materials ultrastructure.