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AFM/ Confocal Raman & Fluorescence/ SNOM/ TERS: NTEGRA Spectra


NTEGRA SpectraIntegration: The key to the new sciences, AFM + Confocal Raman + SNOM
Change happens at interfaces and today’s most exciting changes in microscopy are happening where multiple technologies are interfaced together. The NTEGRA Spectra is a prime example, uniting the full power of atomic force microscopy (AFM), confocal Raman and fluorescence microscopy and scanning near-field optical microscopy (SNOM) in one platform.

Raman Map Mass Center of 2D G Band
Raman Map, Mass Center of 2D (G) Band

Simultaneous AFM and confocal
Raman / Fluorescence imaging

The NTEGRA Spectra supports most of the existing AFM modes (more than 30) providing comprehensive information about physical properties of the sample with nanometer scale resolution: local stiffness, elasticity, conductivity, capacitance, magnetization, surface potential and work function, friction, piezoresponse etc. Simultaneously with AFM, confocal Fluorescence and Raman measurements provide information about sample chemical composition, crystal structure and its orientation, presence of impurities and defects, macromolecular conformation, and so on. Measurements can be performed either through upright or inverted light excitation geometries. The sample can be in a controlled atmosphere or in a liquid environment, all under controlled temperature. Complete Raman /fluorescence spectrum is recorded in each point of 2D / 3D scan with further powerful software analysis. Due to the excellent microscopy performance of the NTEGRA Spectra, 3D spectral distribution can be studied with the spatial resolution reaching the theoretical limit.


Microscopy and spectroscopy at the molecular scale

AFM Topography
AFM topography of Graphene 30 x 30 microns

Diffraction limited spatial resolution and weakness of Raman signal are the two major challenges in Raman microscopy. When using visible light, resolution of classical confocal microscopy does not go below 200 nm. The Raman signal is often only 1/millionth of the strength of a fluorescence signal. The new world of nanotechnology has disclosed a fascinating phenomenon: the electromagnetic field can be strongly enhanced near nanometer-scale metal asperities (“nano-antennas”). The resulting effects are called Surface Enhanced Raman Scattering (SERS) and, when done in conjunction with an SPM tip, one can get Tip-Enhanced Raman Scattering (TERS). By using a specially prepared sharp needle tip, The NTEGRA Spectra can multiply the Raman signal strength by a few orders of magnitude from a precisely scanned, localized spot on the surface several nanometers in diameter. Even single molecules can be detected and recognized by their spectra. Lateral resolution of Raman (TERS) and fluorescence maps is no longer limited by light diffraction and can be less than 15 nm.


The NTEGRA Spectra:

The NTEGRA Spectra is a unique integration of Scanning Probe Microscope, confocal Atomic Force Microscopy (>30 modes)

Contact:

Modes of operation:

Applications:

Specifications:

 Confocal Raman/Fluorescence microscopy
  Confocal Raman/Fluorescence/Rayleigh imaging runs simultaneously with AFM (during one sample scan)
  Diffraction limited spatial resolution: <200 nm in XY, <500 nm in Z (with immersion objective)
  True confocality; push button from software to control the motorized confocal pinhole for optimal signal and confocality
  Motorized variable beam expander/collimator: adjusts diameter and collimation of the laser beam individually for each laser and each   objective used
  Full 3D (XYZ) confocal imaging with powerful image analysis>
  Hyperspectral imaging (recording complete Raman spectrum in every point of 1D, 2D or 3D confocal scan) with further software   analysis
  Hyperspectral imaging (recording complete Raman spectrum in every point of 1D, 2D or 3D confocal scan) with further software   analysis
 AFM/STM: Integration with spectroscopy
  Upright and Inverted optical AFM configurations (optimized for opaque and transparent samples correspondingly); side illumination   option
  Highest possible resolution (numerical aperture) optics is used simultaneously with AFM: 0.7 NA for Upright, 1.3–1.4 NA for Inverted
  AFM/STM and confocal Raman/Fluorescence images are obtained simultaneously (during one scan)
  All standard SPM imaging modes are supported (>30 modes) — combined with confocal Raman/Fluorescence
  Low noise AFM/STM (atomic resolution)
  Vibrations and thermal drifts originating from optical microscope body are minimized due to special design of optical AFM heads
  Focus track feature: sample always stays in focus due to AFM Z-feedback; high quality confocal images of very rough or inclined   samples can be obtained
 Software
  Seamless integration of AFM and Raman; all AFM/ Raman/SNOM experiment and further data analysis is performed in one and the   same software
  Powerful analysis of 1D, 2D and 3D hyperspectral images
  Powerful export to other software (Excel, MatLab, Cytospec etc.)
 Spectroscopy*
  Extremely high efficiency 520 mm length spectrometer with 4 motorized gratings
  Visible, UV and IR spectral ranges available
  Echelle grating with ultrahigh dispersion; spectral resolution: 0.007 nm (< 0.1 1/cm)**
    Up to 3 different detectors can be installed: 
  •  TE cooled (down to -100 ºC) CCD camera. EMCCD camera is optional — for ultrafast imaging
  •  Photon multiplier (PMT) or avalanche photodiode in photon counting mode
  •  Photon multiplier for fast confocal laser (Rayleigh) imaging
  Flexible motorized polarization optics in excitation and detection channels, cross-polarized Raman measurements 
  Fully automated switch between different lasers — with a few mouse clicks
 Scanning Near Field Optical Microscopy (SNOM)
  Two major SNOM techniques supported: (i) based on quartz fiber probes, (ii) based on silicon cantilever probes
  All modes supported: Transmission, Collection, Reflection 
  All SNOM signals detected: laser intensity, fluorescence intensity, spectroscopy
  SNOM lithography (vector, raster)
 Optimized for Tip Enhanced Raman Scattering (TERS) and other tip-related optical techniques (S-SNOM, SNIM,  TEFS,  
 STM-LE etc.)
  All existing TERS geometries are available: illumination / collection from bottom, from top or from side
  Different SPM techniques and TERS probes can be used: STM, AFM cantilever, quartz tuning fork in tapping and shear force modes
  Dual scan (for Hot Point Mapping in TERS): scan by sample AND scan by tip / by laser spot
  Motorized polarization optics to produce optimal polarization for TERS

AFM-Raman measurements can run in air, in controlled atmosphere or in liquid — all with variable temperature
Some features listed are optional — not included into basic system configuration
* NT-MDT AFM can be integrated with Renishaw inVia or with NT-MDT spectrometer. Specifications are given for the latter. Renishaw specifications can be found at www.renishaw.com/AFM-Raman
** Exact value of spectral resolution highly depends on how “resolution” is defined

Contact; Nanounity at info@nanounity.com for more information about the NTEGRA Spectra AFM Raman NSOM system, or feel free to call us at (408) 235-8888.

Raman Map G band Intensity Electrostatic Force Microscopy
           Raman Map, G Band Intensity                                EFM image of Graphene 30 x 30 microns

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