Atomic Force Microscopes

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Affordable Atomic Force Microscopy and Scanning Tunneling Microscopy in an Modular System with Advanced Features : The Solver Nano

The Solver Nano Scanning Probe Microscope (SPM)

The Scanning Probe Microscope (SPM) has become a necessity in many fields that develop, control and measure features at the nanoscale. As these fields grow, there is a need for affordable Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM) solutions for basic research, high resolution imaging and educational purposes. The Solver Nano SPM was designed with this in mind, offering affordable AFM and STM in an modular system.

THE SOLVER NANO SPM

solver nano, Scanning Probe Microscope (SPM)

The Solver Nano is a complete SPM system offering AFM and STM

The Solver Nano is a complete SPM system with advanced features that can be configured as you need it for basic scientific research, high resolution imaging and teaching. The Solver Nano is a compact SPM system, offering affordable AFM and STM with advanced electronics and software in an ergonomic modular design.

The modular design offers three measurement head choices

The modular design offers three measurement head choices that include standard AFM, standard STM and educational AFM/STM. The standard AFM and STM heads work as any commercial measuring head, with cantilever or etched wire tips. The educational SPM measuring head is one unit that uses etched wire tips for both AFM and STM imaging modes. The use of etched wire tips for AFM and STM provides a low cost alternative for consumables which can add up quickly when teaching new users.

Affordable Atomic Force Microscope with advanced features normally found on higher priced SPM systems

The Solver Nano has many advanced features normally found on higher priced SPM systems. The system has a 100x100x10 micron closed-loop scanner that works in high and low voltage mode depending on scan size and resolution required, features for quick and easy cantilever alignment, advanced imaging and measurement modes including scanning Kelvin probe microscopy (SKM), magnetic force microscopy (MFM), piezo force response microscopy (PFM), force spectroscopy and nanolithography.

The system has an optional tip etching and preparation station

The system has an optional tip etching and preparation station for use with the standard STM or educational measuring heads. The tip etching station provides several benefits; it allows you to easily and consistently make sharp STM tips, and it can be used to teach students as part of a science curriculum.

The Solver Nano is the perfect system for labs with basic SPM research needs

With these features and advanced capabilities the Solver Nano is the perfect system for labs with basic SPM research needs, people with limited budgets requiring advance imaging modes and teaching new AFM and STM users.

Contact Nanounity at info@nanounity.com for more information about the Solver Nano, or feel free to call us at (408) 235-8888

Solver Nano System Features:

Full range of scanning techniques standard:	AFM Contact and semi-contact modes, phase imaging, LFM, force vs. distance spectroscopy, EFM, MFM, Kelvin probe mode, SCM, spreading resistance imaging et al.
Easy-to-adjust cantilever alignment:	Special chips with alignment grooves provides fixed AFM probe placement in the measuring head. This feature reduces the alignment of the cantilever and feedback detection system.
Compact rigid design:	Small mechanical loop provides operation reliability and high immunity to environmental conditions. (vibration isolation required to achieve noise floor specification)
Automatic setting of scanning parameters:	Digital controller with adjustable PID feedback guaranties the high quality of imaging.
Metrology scanning:	Universal closed-loop scanner provides max scan size 100x100x10 um and atomic resolution at nanometer size scans.
Comprehensive software:	Up to 8 signals Simultaneous under scanning and up to 3 signals under spectroscopy.

System Description:

Main AFM / STM Modes
Atomic Force Microscopy: contact and semi-contact modes/ EFM/ SCM/ Kelvin mode/ Piezo force microscopy/ MFM/ Spreading resistance mode/ Force spectroscopy modes
Scanning Tunnel Microscopy: constant current, constant height, I(Z) spectroscopy, I(V) spectroscopy
AFM lithography: scratching, anodic oxidation
Instrument Parameters
Sample positioning:	manual, 5x5 mm range
Sample size:	up to 25 mm diameter, thickness up to 10 mm
Scanner type:	piezo tube scanner, closed-loop feedback
Scanning type:	scanning by sample
Scanning range:	100×100×10 um
Approach system:	by sample, motorized, 10 mm range
Optical viewing:	embedded USB-camera
Overall dimensions:	170×150×150 mm

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