Atomic Force Microscopes

NANOEDUCATOR | NTEGRA Platform | AFM Raman | Solver Next | Affordable AFM

Solver Next

Solver next

The Solver Next is the first to offer a new concept in general purpose Scanning Probe Microscopes. This new Scanning Probe Microscope design offers desk top automation opening the way for all user levels to acquire quality Scanning Probe Microscope images in a short amount of time. The hassle of manual setup has been eliminated. Intuitive automation guides you through the setup, adjustment and samples measurements.

Automated exchange between built-in Atomic Force Microscope and Scanning Tunneling Microscope heads, gives users the option to run a variety of modes on the same system without physically exchanging hardware configurations.
With a few mouse clicks in the software, you can easily switch between these two measuring heads and be on your way to results.

Advanced modes of operation at your fingertips! With the built-in measuring heads you’ll have access to numerous advanced modes of SPM, all you have to do is select the mode and start scanning.
Two built-in closed-loop measuring heads provide a comprehensive range of modes as our standard configuration;

AFM-contact, semi-contact, non-contact

AFM Topography of Collagen Matrix
Lateral Force Microscopy (LFM)
Force Curve acquisition and mapping
Electrostatic Force Microscopy (EFM)
Scanning Kelvin Probe Microscopy (SKPM)
Conductive AFM
Scanning Spreading Resistance Microscopy (SSRM)
Magnetic Force Microscopy (MFM)
Force Modulation Microscopy (FMM)
Piezoresponse Force Microscopy (PFM)
Nanolithography
Nanomanipulation
Scanning Tunneling Microscopy (STM)

The Solver Next has a high resolution top-view optical microscope. The ergonomic design incorporates the microscope into the system and is easily operated through the software controls. Users can quickly move to their area of interest with motorized sample positioning. Once at the desired location you can zoom or pan to optimize your optical view.

NT-MDT is forward thinking in the design and applications of their SPM products. No matter where you are, having access to your instrument or data is critical, whether you’re in a meeting and want to share images with colleagues or need to log in remotely and help your student collect publishable data. The Solver Next has special applications that let you use your iPhone, iPad or computer to access your data or system.

2LNextIFon

There's much more to the Solver Next than the integrated Atomic Force Microscope & Scanning Tunneling Microscope, hardware & software automation, with an ergonomic design that's easy to use at a reasonable price...

Atomic Force Microscopy (>30 modes)
Scanning Tunneling Microscopy
Nanolithography and Nanomanipulation
Single click alignment of laser to cantilever
Closed-loop feedback for all Scanning Probe Microscope Modes
Low noise measurements
High resolution optical microscope
Enclosure with automated door that monitors humidity and temperature of scan chamber
Fast Atomic Force Microscopy scanning up to 40 Hz dependent on sample
Optional liquid cell, sample heater and nanoindentation
Remote access and control with your iPad and iPhone applications for reviewing and sharing your images
Much more...

Application examples:


	STM Topography of HOPG, the total Z range is 1.8nm and the atomic step height is 3.3 A		AFM topography in semi-contact mode of polymer aggregates

	AFM topography in semi-contact mode of bilayer steps on the SrTiO3 (001) surface, the step-height is 0.39 nm.

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