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The NTEGRA is a revolutionary concept in Scanning Probe Microscopy. It was designed specifically to form a Scanning Probe Microscope base platform for integration with cutting-edge analysis technologies such as Raman spectroscopy and other leading analytical techniques. The NTEGRA is a scalable platform and expands modularly with your application needs. Each NTEGRA platform shares the same Scanning Probe Microscope core, electronic controller and software. Instead of investing in a complete new system, you simply add the module that meets your current application.
There is a wide variety of advanced scanning probe modes in use today. Many of these modes are standard with the NTEGRA.

• Atomic Force Microscopy
• Lateral Force Microscopy
• Force Curves and Mapping
• Magnetic Force Microscopy
• Electro Static Force Microscopy
• Scanning Kelvin Probe Microscopy
• Piezoresponse Force Microscopy
• Nanolithography
• Nanomanipulation
• Adhesion Force Imaging
• Many more... 

The NTEGRA currently offers eight solutions for various Scanning Probe Microscope applications. Each system offers superior performance and has its own area of specialization.

• NTEGRA Prima - is a high resolution, low noise Scanning Probe Microscope ideal for advanced multi-user laboratories.
• NTEGRA Therma - performs Scanning Probe Microscopy measurements at either constant or variable temperatures from -30 0C to 300 0C. The Therma low drift head maintains a drift of less than 15nm/0C.
• NTEGRA Aura - performs Atomic Force Microscope measurements in vacuum down to 10-2 torr or under controlled atmosphere environments.
• NTEGRA Maximus - Atomic Force Microscope has a unique high throughput screening capability of multiple samples as well as measurements on large sample substrates.
• NTEGRA Solaris - uses Near-Field Scanning Optical Microscopy (NSOM or SNOM) to investigate optical properties beyond conventional limits imposed by diffraction.
• NTEGRA Spectra - integrates Scanning Probe Microscopy with Raman spectroscopy and laser confocal microscopy to study the distribution of chemical properties with molecular resolution. The Spectra is the first commercialized Tip Enhanced Raman Scattering (TERS) ready system. This improves both spatial resolution and Raman sensitivity.
• NTEGRA Vita - combines the strengths of Atomic Force Microscopy with an inverted optical microscope for biological and liquid applications.
• NTEGRA Tomo- is a unique industry leading innovation, integrating Atomic Force Microscopy with ultramicrotomy to perform Atomic Force Microscope tomography and 3D reconstruction of biological and materials ultrastructure.

Application examples:

	Piezoresponse Force Microscopy image of PTO/SRO/STO Sample		AFM topography in semi-contact mode of onion skin fibrils in PBS solution
	AFM topography in semi-contact mode of fractal comprised of Ag nano particles, the scan area is 10µm x 10µm		AFM topography in semi-contact mode of nanoporous matrix

more about: NanoEducator-educational AFM for teaching
more about: Solver Nano-affordable AFM with advanced modes for routine imaging and basic research
more about: Spectra-AFM Confocal Raman, NSOM and TERS
more about: Solver Next- automated desktop AFM for ease-of-use
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