product overview

Nanounity is a sales and marketing company, specializing in nanoscale imaging and analysis instrumentation. We provide unique solutions for Atomic Force Microscopy, Scanning Electron Microscopy and related products. We accomplish this through strategic partnerships with technology manufacturers. Together our goal is to provide innovative solutions to reach your scientific and engineering endeavors.
Our products span a wide range of applications, covering many scientific and engineering fields, from material science to biotechnology and everywhere in between. Following are examples of our products solutions.

• Topcon Aquila compact SEM and Optical Microscope system:
   
  • Topcon Aquila SEM
  • Compact scanning electron microscope (SEM)
  • Integrated optical microscope
  • Alternative to Tabletop SEM
  • Alternative to Desktop SEM
  • Tabletop SEM
  • Desktop SEM
  • Personal SEM
  • Small footprint SEM
  • Topcon Aquila Microanalysis
  • Energy Dispersive Spectroscopy (EDS)
  • EDAX EDS
     
• NT-MDT Scanning Probe Microscopes
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  • NanoEducator-educational AFM for teaching

    • Scanning Probe Microscope for teaching nanotechnology
    • AFM and STM modes
    • Curriculum with experiments for AFM and STM that teach fundamental principles in physics and chemistry

    Solver Nano-affordable AFM with advanced modes for routine imaging and basic research

    • Affordable Atomic Force Microscope
    • Modular Scanning Probe Microscope
    • AFM, STM and educational measuring heads
    • Ease to align AFM cantilevers
    • High resolution AFM and STM imaging to atomic resolution
    • Closed-loop AFM scanner for accurate images and measurements
    • Many advanced modes standard including SKM, MFM, EFM, PFM, SSRM and SCM

    Solver Next- automated desktop AFM for ease-of-use

    • Built in AFM and STM heads with automated exchange
    • Automatic laser and photodiode alignment
    • Easy-to-use
    • software controls AFM feedback parameters
    • Many advanced modes standard including SKM, MFM, EFM, PFM, SSRM and SCM
    • Fast scanning AFM up to 40Hz scan speed over 100 X 100 micron area

    NTEGRA Spectra-AFM Confocal Raman, NSOM and TERS System

    • High resolution atomic force microscope
    • Confocal Raman microscope
    • Confocal Raman spectrometer
    • White light microscopy and laser confocal microscopy
    • Scanning near-field microscope
    • Tip enhanced Raman scattering
    • Tip enhanced Raman spectroscopy

    NTEGRA-Multi-purpose high resolution AFM that is configurable for different applications

    • Atomic Force Microscopy
    • Scanning Tunneling Microscopy
    • Scanning near-field Microscopy
    • Piezoresponse Force Microscopy
    • Magnetic Force Microscopy
    • Scanning Kelvin Probe Microscopy
    • Nanolithography
    • Nanomanipulation
    • Acoustic Atomic Force Microscopy
    • AFM at elevated or cooled temperatures
    • AFM and STM with optical configurations
    • Scan by tip, sample or both in AFM, STM and NSOM
• Ionscope:
  • Scanning Ion Conductance Microscopes (SICM)
    
    
• AEP Technology Surface Metrology Systems:
  • Contact Surface Profilometer
  • Scanning Tip Surface Profilometer
  • Non-contact Optical Surface Profilometer
  • Universal Surface Profilometer, Contact and Optical Profilometer in one system
    
  • Surface Profiling
  • Thin Film Stress Measurement
  • Optical Metrology

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